| Presentation | 1997/12/11 Reliabihty design which uses FEM analysis for thick film substrate Takashi Nagasaka, Yuji Ootani, Kengo Oka, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | For a thick film substrate, residual stress occurs at the connections of different material on the substrate. We understood that cracks occur due to the stress and a resistance value change of the resistors occur. The author clarified the causes based on a FEM analysis result of a substrate cross-section design and reviewed countermeasures. As a result, we were able to decrease the residual stress mentioned above and prevent the occurrence of cracks by optimizing the thermal expansion coefficient of each material. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Thick Film Substrate / Tensile Stress / FEM / Resistance Drift / TCE |
| Paper # | CPM97-148 |
| Date of Issue |
| Conference Information | |
| Committee | CPM |
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| Conference Date | 1997/12/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Reliabihty design which uses FEM analysis for thick film substrate |
| Sub Title (in English) | |
| Keyword(1) | Thick Film Substrate |
| Keyword(2) | Tensile Stress |
| Keyword(3) | FEM |
| Keyword(4) | Resistance Drift |
| Keyword(5) | TCE |
| 1st Author's Name | Takashi Nagasaka |
| 1st Author's Affiliation | Electronics R&D Dept., DENSO CORPORATION() |
| 2nd Author's Name | Yuji Ootani |
| 2nd Author's Affiliation | Electronics R&D Dept., DENSO CORPORATION |
| 3rd Author's Name | Kengo Oka |
| 3rd Author's Affiliation | Electronics R&D Dept., DENSO CORPORATION |
| Date | 1997/12/11 |
| Paper # | CPM97-148 |
| Volume (vol) | vol.97 |
| Number (no) | 433 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |