Presentation | 2000/7/21 Relation between Capture Effect and Forward Error Correction Daisuke IKUTA, Kaori TOMITA, Fumio TAKAHATA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Based on results obtained by the in-door experiment concerning the capture effect, the paper clarifies the relation between the bit error rate(BER)and the ratio of signal power density with high power wave and low power wave. The discussion focusses on the difference between BER characteristics using two different forward error correction techniques, Viterbi decoding and sequencial decoding. Furthermore the condition to obtain the catpture effect is modeled by introducing a standard interference ratio and this modeling is confirmed to be useful from the fact that BER characteristics in various parameter setting can be related with each other based on the standard interference ratio. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Capture effect / Viterbi decoding / Sequencial decoding / Standard interference ratio / Bit error rate |
Paper # | A・P2000-66,SAT2000-63,MW2000-66 |
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Committee | SAT |
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Conference Date | 2000/7/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Satellite Telecommunications (SAT) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Relation between Capture Effect and Forward Error Correction |
Sub Title (in English) | |
Keyword(1) | Capture effect |
Keyword(2) | Viterbi decoding |
Keyword(3) | Sequencial decoding |
Keyword(4) | Standard interference ratio |
Keyword(5) | Bit error rate |
1st Author's Name | Daisuke IKUTA |
1st Author's Affiliation | Graduate School of Science and Engineering, Waseda University() |
2nd Author's Name | Kaori TOMITA |
2nd Author's Affiliation | Graduate School of Science and Engineering, Waseda University |
3rd Author's Name | Fumio TAKAHATA |
3rd Author's Affiliation | Graduate School of Science and Engineering, Waseda University |
Date | 2000/7/21 |
Paper # | A・P2000-66,SAT2000-63,MW2000-66 |
Volume (vol) | vol.100 |
Number (no) | 222 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |