Presentation 2000/7/19
A・P2000-32 / SAT2000-29 / MW2000-32 Time Domain Analysis of edge diffraction in terms of equivalent edge currents
Eklise BRUCKERT, Suomin CUI, Ken-ichi SAKINA, Makoto ANDO,
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Abstract(in English) A time-domain version of the edge diffraction in term of edge currents using the modified edge representation is developed to describe the transient electromagnetic field from a perfectly conducting arbitrarily scattering object excited by a general high frequency time impulsive wave front. By solving analytically the Fourier transform of the Modified Edge Representation expression, this leads us to an analytical expression of the scattered field simple line integration on the edge of the scatterer where the integrant is a linear function of the incident field.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Time Domain Modified Edge Representation(TDMER) / Edge Diffraction / Time Domain representation / Modified Edge Repressentation(MER) / Equivalent Edge Current / target signature
Paper # A・P2000-32,SAT2000-29,MW2000-32
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Committee SAT
Conference Date 2000/7/19(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A・P2000-32 / SAT2000-29 / MW2000-32 Time Domain Analysis of edge diffraction in terms of equivalent edge currents
Sub Title (in English)
Keyword(1) Time Domain Modified Edge Representation(TDMER)
Keyword(2) Edge Diffraction
Keyword(3) Time Domain representation
Keyword(4) Modified Edge Repressentation(MER)
Keyword(5) Equivalent Edge Current
Keyword(6) target signature
1st Author's Name Eklise BRUCKERT
1st Author's Affiliation Dept.of Electrical and Electronic Engineering, Tokyo Institute of Technology()
2nd Author's Name Suomin CUI
2nd Author's Affiliation Dept.of Electrical and Electronic Engineering, Tokyo Institute of Technology
3rd Author's Name Ken-ichi SAKINA
3rd Author's Affiliation Dept.of Electrical and Electronic Engineering, Tokyo Institute of Technology
4th Author's Name Makoto ANDO
4th Author's Affiliation Dept.of Electrical and Electronic Engineering, Tokyo Institute of Technology
Date 2000/7/19
Paper # A・P2000-32,SAT2000-29,MW2000-32
Volume (vol) vol.100
Number (no) 220
Page pp.pp.-
#Pages 8
Date of Issue