Presentation | 2001/10/19 Explanation Generation System for Learning Measurement Systems Kazumoto TANAKA, Yoshinobu KUROSE, Yoneo YANO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have developed a prototype of the system that can generate explanation of the behavior and the functions from specifications and a block-diagram of a measurement system. This paper shows a way for expressing behavior and functions by carrier attributes of a measurement system and attributes of measuring information. In addition, we introduce adjective expression into the description of measuring information attributes in order to explain functions and device specifications that contribute to the achievement of requirement specifications. A method for generating the model that constitute functional context fitting to specifications is proposed in the paper. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Behavior / Function / Explanation Generation / Attribute Information / Measurement Systems |
Paper # | ET2001-51 |
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Committee | ET |
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Conference Date | 2001/10/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Educational Technology (ET) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Explanation Generation System for Learning Measurement Systems |
Sub Title (in English) | |
Keyword(1) | Behavior |
Keyword(2) | Function |
Keyword(3) | Explanation Generation |
Keyword(4) | Attribute Information |
Keyword(5) | Measurement Systems |
1st Author's Name | Kazumoto TANAKA |
1st Author's Affiliation | Graduate School of Engineering, Tokushima University() |
2nd Author's Name | Yoshinobu KUROSE |
2nd Author's Affiliation | Faculty of Engineering, Kinki University |
3rd Author's Name | Yoneo YANO |
3rd Author's Affiliation | Faculty of Engineering, Tokushima University |
Date | 2001/10/19 |
Paper # | ET2001-51 |
Volume (vol) | vol.101 |
Number (no) | 397 |
Page | pp.pp.- |
#Pages | 7 |
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