| Presentation | 2001/8/28 1D Magnetic Near Field Distribution Measurements on LSI Package Pins by Using Magneto-Optic Probe Mizuki Iwanami, Etsushi Yamazaki, Ken Nakano, Toshio Sudo, Satoru Haga, Shigeki Hoshino, Shinichi Wakana, Masato Kishi, Masahiro Tsuchiya, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | To investigate the radiation source and the radiation mechanism in a printed circuit board(PCB), we measured the one dimensional(1D)magnetic near field distribution on the package pins of a controllable LSI by using the magneto-optic probe. The magneto-optic probe has a structure that consists of an optical fiber and a magneto-optic crystal glued at a fiber edge. The spatial resolution of our probe is about 100μm. The width and the interval of the LSI package pins are 200μm and 500μm, respectively. From the measured results, it was found that our probe can resolve the magnetic field generateod from each LSI pin. We compared the radiated electric field strength from the PCB by means of 3 m method with the magnetic near field strength on the pins at the frequency which is ten times as many as the fundamental frequency of the clock signal for four kinds of LSI operation modes. It was found that the radiation strengths are correlated with the peak strengths in the magnetic field distributions among these LSI operation modes. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI / Operation Mode / Printed Circuit Board / Radiated Electric Field Strength / Magneto-Optic Probe / 1D Magnetic Near Field Distribution Measurement |
| Paper # | EMCJ2001-51 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2001/8/28(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | 1D Magnetic Near Field Distribution Measurements on LSI Package Pins by Using Magneto-Optic Probe |
| Sub Title (in English) | |
| Keyword(1) | LSI |
| Keyword(2) | Operation Mode |
| Keyword(3) | Printed Circuit Board |
| Keyword(4) | Radiated Electric Field Strength |
| Keyword(5) | Magneto-Optic Probe |
| Keyword(6) | 1D Magnetic Near Field Distribution Measurement |
| 1st Author's Name | Mizuki Iwanami |
| 1st Author's Affiliation | Association of Super-Advanced Electronics Technologies(ASET)() |
| 2nd Author's Name | Etsushi Yamazaki |
| 2nd Author's Affiliation | Department of Electronic Engineering, the University of Tokyo |
| 3rd Author's Name | Ken Nakano |
| 3rd Author's Affiliation | Association of Super-Advanced Electronics Technologies(ASET) |
| 4th Author's Name | Toshio Sudo |
| 4th Author's Affiliation | Association of Super-Advanced Electronics Technologies(ASET) |
| 5th Author's Name | Satoru Haga |
| 5th Author's Affiliation | Association of Super-Advanced Electronics Technologies(ASET) |
| 6th Author's Name | Shigeki Hoshino |
| 6th Author's Affiliation | Association of Super-Advanced Electronics Technologies(ASET) |
| 7th Author's Name | Shinichi Wakana |
| 7th Author's Affiliation | Department of Electronic Engineering, the University of Tokyo |
| 8th Author's Name | Masato Kishi |
| 8th Author's Affiliation | Department of Electronic Engineering, the University of Tokyo |
| 9th Author's Name | Masahiro Tsuchiya |
| 9th Author's Affiliation | Department of Electronic Engineering, the University of Tokyo |
| Date | 2001/8/28 |
| Paper # | EMCJ2001-51 |
| Volume (vol) | vol.101 |
| Number (no) | 274 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |