Presentation 2001/4/12
Shielding and Absorption by a Multilayered Material for Electromagnetic Waves with Oblique Incidence
Yoshiyuki YOSHIMURA, Isamu NAGANO, Satoshi YAGITANI, Tomohiko UENO, Toshio OOURA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) TEM, TE and TM mode waves are usually used for the estimation of electromagnetic(EM) shielding or absorption by a material. However the EM wave is actually incident on the shielding material with arbitrarily polarization and incident angle. In this study, the EM shielding and absorption by a multi-layered material are estimated theoretically on the basis of Maxwell's equations. For example, shielding effectiveness (the inverse of transmission coefficient) and reflection coefficient of a λ/4 type wave absorber are calculated. The EM shielding and absorption performance varies with the angle of E-field polarization and the angle of incidence. Therefore, the direction of polarization and incident angle need to be considered when designing a wave absorber.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) oblique incidence / multilayered material / reflection coefficient / transmission coefficient / shielding effectiveness
Paper # EMCJ2001-5
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Conference Information
Committee EMCJ
Conference Date 2001/4/12(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Shielding and Absorption by a Multilayered Material for Electromagnetic Waves with Oblique Incidence
Sub Title (in English)
Keyword(1) oblique incidence
Keyword(2) multilayered material
Keyword(3) reflection coefficient
Keyword(4) transmission coefficient
Keyword(5) shielding effectiveness
1st Author's Name Yoshiyuki YOSHIMURA
1st Author's Affiliation Department of Information and Systems Engineering, Kanazawa University:Department of Machinery and Electronics, Industrial Research Institute of Ishikawa()
2nd Author's Name Isamu NAGANO
2nd Author's Affiliation Department of Information and Systems Engineering, Kanazawa University
3rd Author's Name Satoshi YAGITANI
3rd Author's Affiliation Department of Information and Systems Engineering, Kanazawa University
4th Author's Name Tomohiko UENO
4th Author's Affiliation Department of Information and Systems Engineering, Kanazawa University
5th Author's Name Toshio OOURA
5th Author's Affiliation Department of Machinery and Electronics, Industrial Research Institute of Ishikawa
Date 2001/4/12
Paper # EMCJ2001-5
Volume (vol) vol.101
Number (no) 7
Page pp.pp.-
#Pages 6
Date of Issue