Presentation 2001/4/12
Analysis of Relationship between LSI Operation Modes and Radiated Emission from PCB
Satoru Haga, Ken Nakano, Toshio Sudo,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The relationship between LSI operation modes and radiated emission were studied. Among operation modes, I/O buffer operation radiated a large amount of emission. In this mode, widely distributed high frequency currents and imbalance in each power and ground wiring pair were observed. LSI mounting area can be considered an opening from the electromagnetic viewpoint, though it has high density of high frequency currents. Measures should be taken at LSI mounting area. It has been verified by putting ferrite on LSl package and covering LSI package with copper plate having ground connections, which reduce the emission by approximately 7dB, 13dB respectively.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LSI / Operation Mode / Near Electromagnetic Field / Radiated Emission
Paper # EMCJ2001-2
Date of Issue

Conference Information
Committee EMCJ
Conference Date 2001/4/12(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of Relationship between LSI Operation Modes and Radiated Emission from PCB
Sub Title (in English)
Keyword(1) LSI
Keyword(2) Operation Mode
Keyword(3) Near Electromagnetic Field
Keyword(4) Radiated Emission
1st Author's Name Satoru Haga
1st Author's Affiliation Association of Super-Advanced Electronics Technologies(ASET)()
2nd Author's Name Ken Nakano
2nd Author's Affiliation Association of Super-Advanced Electronics Technologies(ASET)
3rd Author's Name Toshio Sudo
3rd Author's Affiliation Association of Super-Advanced Electronics Technologies(ASET)
Date 2001/4/12
Paper # EMCJ2001-2
Volume (vol) vol.101
Number (no) 7
Page pp.pp.-
#Pages 6
Date of Issue