Presentation 2001/6/15
Resolution Improvment of E-field Probe with Deconvolution
Hiroshi Hirayama, Yoshio Kami,
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Abstract(in English) This report describes a method to improve resolution of an E-field probe with signal processing technique without hardware modification. In order to study the emission to from PCB, for example, it is useful to obtain near field distribution. Existing method has been obtained E-field strength distribution by scanning an E-field probe and multiplying its antenna factor by the output voltage. However, the method has following disadvantage: 1)the corredation between near E/M field distribution and the probe output voltage has not been proved, 2)there is not enough resolution for the latest small schematic. In this report, we propose a new method, which makes it possible to reduct those problems by using E-probe's spatial responses. Experimental results show that proposed method can separate two null points, which can not separated with conventional method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) E-field probe / point spread function(PSF) / deconvolution
Paper # EMCJ2001-26
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Committee EMCJ
Conference Date 2001/6/15(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Resolution Improvment of E-field Probe with Deconvolution
Sub Title (in English)
Keyword(1) E-field probe
Keyword(2) point spread function(PSF)
Keyword(3) deconvolution
1st Author's Name Hiroshi Hirayama
1st Author's Affiliation The University of Electro-Communications()
2nd Author's Name Yoshio Kami
2nd Author's Affiliation The University of Electro-Communications
Date 2001/6/15
Paper # EMCJ2001-26
Volume (vol) vol.101
Number (no) 129
Page pp.pp.-
#Pages 6
Date of Issue