Presentation | 2001/1/18 Simulation of the Effects of a Reflection object to Site Attenuation for EMI Measurement Makoto Takashima, Takashi Iwasaki, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The effects of a reflection object to site attenuation for EMI measurement are analyzed using the Method of Moment with planar-segments. The object is placed on the CISPR Fresnel ellipse of a test site and the other. As a result, a position of the object where the effect becomes large is pointed out. Also, the effect of changing a distance from the center of the ellipse and the effect of changing the size of the reflection object are analyzed. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Reflection object / Site Attenuation / Method of Moment with planar-segments |
Paper # | EMCJ 2000-125 |
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Committee | EMCJ |
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Conference Date | 2001/1/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Simulation of the Effects of a Reflection object to Site Attenuation for EMI Measurement |
Sub Title (in English) | |
Keyword(1) | Reflection object |
Keyword(2) | Site Attenuation |
Keyword(3) | Method of Moment with planar-segments |
1st Author's Name | Makoto Takashima |
1st Author's Affiliation | Department of Electronic Engineering, The University of Electro-communications() |
2nd Author's Name | Takashi Iwasaki |
2nd Author's Affiliation | Department of Electronic Engineering, The University of Electro-communications |
Date | 2001/1/18 |
Paper # | EMCJ 2000-125 |
Volume (vol) | vol.100 |
Number (no) | 577 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |