Presentation 2001/1/18
Simulation of the Effects of a Reflection object to Site Attenuation for EMI Measurement
Makoto Takashima, Takashi Iwasaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The effects of a reflection object to site attenuation for EMI measurement are analyzed using the Method of Moment with planar-segments. The object is placed on the CISPR Fresnel ellipse of a test site and the other. As a result, a position of the object where the effect becomes large is pointed out. Also, the effect of changing a distance from the center of the ellipse and the effect of changing the size of the reflection object are analyzed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Reflection object / Site Attenuation / Method of Moment with planar-segments
Paper # EMCJ 2000-125
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Conference Information
Committee EMCJ
Conference Date 2001/1/18(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Simulation of the Effects of a Reflection object to Site Attenuation for EMI Measurement
Sub Title (in English)
Keyword(1) Reflection object
Keyword(2) Site Attenuation
Keyword(3) Method of Moment with planar-segments
1st Author's Name Makoto Takashima
1st Author's Affiliation Department of Electronic Engineering, The University of Electro-communications()
2nd Author's Name Takashi Iwasaki
2nd Author's Affiliation Department of Electronic Engineering, The University of Electro-communications
Date 2001/1/18
Paper # EMCJ 2000-125
Volume (vol) vol.100
Number (no) 577
Page pp.pp.-
#Pages 6
Date of Issue