Presentation 2000/11/10
Analysis of Relationship between LSI Operation Modes and Near Electromagnetic Field of Power Supply Lines
Ken Nakano, Satoru Haga, Toshio Sudo,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) To study the relationship between LSI operation modes and near electromagnetic field, the test printed circuit board with LSI operating in specified mode was developed and its near-field magnetic distribution was measured. The measurements near bypass capacitors and above ground plane show that I/O buffer operation mode has a few different peaks in frequency compared with other internal operation modes. The peaks are found to be relevant to resonant frequencies between power and ground planes. The results show that ground current of the noise source is considerably affected by the impedance between power and ground planes when external traces are driven.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LSI / Operation Mode / Power Supply Line / Electromagnetic Field / PCB / Impedance
Paper # EMCJ2000-98
Date of Issue

Conference Information
Committee EMCJ
Conference Date 2000/11/10(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of Relationship between LSI Operation Modes and Near Electromagnetic Field of Power Supply Lines
Sub Title (in English)
Keyword(1) LSI
Keyword(2) Operation Mode
Keyword(3) Power Supply Line
Keyword(4) Electromagnetic Field
Keyword(5) PCB
Keyword(6) Impedance
1st Author's Name Ken Nakano
1st Author's Affiliation Association of Super-Advanced Electronics Technologies(ASET)()
2nd Author's Name Satoru Haga
2nd Author's Affiliation Association of Super-Advanced Electronics Technologies(ASET)
3rd Author's Name Toshio Sudo
3rd Author's Affiliation Association of Super-Advanced Electronics Technologies(ASET)
Date 2000/11/10
Paper # EMCJ2000-98
Volume (vol) vol.100
Number (no) 446
Page pp.pp.-
#Pages 6
Date of Issue