Presentation 2000/7/14
Analysis of Far-end Crosstalk using Two Paralell Microstrip Lines Considering C-V Characteristics
Akiyoshi Hirao, Fujihiko Matsumoto, Yasuaki Noguchi,
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Abstract(in English) The high-speed and large-capacity digital communication has been required to date. The crosstalk noise is one of the most important problems to be solved, which leads malfunction in data transmission equipments. In this study, a silicon diode and a variable capacitance diodes are used as nonlinear loads of the microstrip lines. The waveform of the far-end of crosstalk is measured and analyzed using a 4-port network model in the time domain. It is shown that the C-V characteristics of diode influences the waveform of the crosstalk and that it is valid to calculate the waveform considering the capacitance of the loads to be constant, if the dependence of the capacitance upon the voltage is small.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Microstrip Lines / Far-end Crosstalk / 4-port network / Silicon diode / Variable diode
Paper # EMCJ2000-31
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Committee EMCJ
Conference Date 2000/7/14(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis of Far-end Crosstalk using Two Paralell Microstrip Lines Considering C-V Characteristics
Sub Title (in English)
Keyword(1) Microstrip Lines
Keyword(2) Far-end Crosstalk
Keyword(3) 4-port network
Keyword(4) Silicon diode
Keyword(5) Variable diode
1st Author's Name Akiyoshi Hirao
1st Author's Affiliation Department of Applied Physics, National Defense Academy()
2nd Author's Name Fujihiko Matsumoto
2nd Author's Affiliation Department of Applied Physics, National Defense Academy
3rd Author's Name Yasuaki Noguchi
3rd Author's Affiliation Department of Applied Physics, National Defense Academy
Date 2000/7/14
Paper # EMCJ2000-31
Volume (vol) vol.100
Number (no) 207
Page pp.pp.-
#Pages 5
Date of Issue