Presentation | 2000/4/18 A Study on Mesurement of Complex Permittivity of Dielectric Sample using Rectangular Cavity Resonator by FDTD Method Koji Shibata, Hirofumi Inagami, Osamu Hashimoto, Takeshi Takahashi, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this study, the author presents the non-destructive measurement method that the imaginary part of the complex permittivity of thin dielectric sample which conforms the slit of the cavity resonator is estimated. In the present study, the author calculates the quality factor using finite difference time domain (FDTD) method, on condition that a thin sample is inserted into the rectangular cavity resonator. The exellent agreement is obtained between calclation and measurement, where the variation of the absolute refrection coefficient between them, is about 9 percent. The author provided here the measurement chat by the relation between the quality factor calclated by FDTD method and the imaginary part of the permittivity, and then the measurement chart could be used for practical measurement. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | non-destructive measurement / Rectangular Cavity Resonator / Complex Permittivity / Error |
Paper # | EMCJ2000-6 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 2000/4/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study on Mesurement of Complex Permittivity of Dielectric Sample using Rectangular Cavity Resonator by FDTD Method |
Sub Title (in English) | |
Keyword(1) | non-destructive measurement |
Keyword(2) | Rectangular Cavity Resonator |
Keyword(3) | Complex Permittivity |
Keyword(4) | Error |
1st Author's Name | Koji Shibata |
1st Author's Affiliation | Dept.of Electronics and Electrical Engineering, Aoyama Gakuin University() |
2nd Author's Name | Hirofumi Inagami |
2nd Author's Affiliation | Dept.of Electronics and Electrical Engineering, Aoyama Gakuin University |
3rd Author's Name | Osamu Hashimoto |
3rd Author's Affiliation | Dept.of Electronics and Electrical Engineering, Aoyama Gakuin University |
4th Author's Name | Takeshi Takahashi |
4th Author's Affiliation | Materials Research Center, TDK Corporation |
Date | 2000/4/18 |
Paper # | EMCJ2000-6 |
Volume (vol) | vol.100 |
Number (no) | 8 |
Page | pp.pp.- |
#Pages | 7 |
Date of Issue |