Presentation 2000/4/18
Estimation of Electromagnetic Noise from Digital IC by Using Small Size TEM Cell
Masahiro Takahashi, Masakazu Fujita, Satoshi Kazama, Shinichi Shinohara, Risaburo Sato,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper describes a method for measuring adjacent electromagnetic fields from digital ICs using small size TEM cells. This method calculates the adjacent electric and magnetic fields from the IC by measuring the outputs from the TEM cell in a four-directional setup of the device under test(DUT). The method is verified by using micro-strip lines as the DUT. The adjacent magnetic field from the digital IC as measured by this method agrees with the adjacent magnetic field as measured by a magnetic probe (shielded loop). This method is effective for evaluating adjacent electromagnetic fields from digital ICs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Digital IC / Electromagnetic noise / EMI / Measuring method / Evaluation method
Paper # EMCJ2000-5
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Committee EMCJ
Conference Date 2000/4/18(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Estimation of Electromagnetic Noise from Digital IC by Using Small Size TEM Cell
Sub Title (in English)
Keyword(1) Digital IC
Keyword(2) Electromagnetic noise
Keyword(3) EMI
Keyword(4) Measuring method
Keyword(5) Evaluation method
1st Author's Name Masahiro Takahashi
1st Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.()
2nd Author's Name Masakazu Fujita
2nd Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.
3rd Author's Name Satoshi Kazama
3rd Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.
4th Author's Name Shinichi Shinohara
4th Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.
5th Author's Name Risaburo Sato
5th Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.
Date 2000/4/18
Paper # EMCJ2000-5
Volume (vol) vol.100
Number (no) 8
Page pp.pp.-
#Pages 6
Date of Issue