Presentation | 1999/4/22 The Estimation of Current and Voltage Distributions by Using a Small Size Probe Satoshi Kazama, Shinichi Shinohara, Risaburo Sato, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, the estimation method of current and voltage distributions by scanning a probe is proposed. This method uses the phenomenon that the coupling between the current and the probe is varied by the probe direction. Actually, the current and voltage are estimated by calculating the probe vector output at four directions. Therefore, both current and voltage vector distributions can be estimated at the same time by one probe. The current and voltage distributions in a digital IC package by this method are estimated. And, the method is investigated by using these estimated results. The probe used in this method seems to be able to reduce its size, because it has simple structure. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Current distribution / Voltage distribution / Estimation / Digital IC / Small size probe |
Paper # | EMCJ99-5 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 1999/4/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | The Estimation of Current and Voltage Distributions by Using a Small Size Probe |
Sub Title (in English) | |
Keyword(1) | Current distribution |
Keyword(2) | Voltage distribution |
Keyword(3) | Estimation |
Keyword(4) | Digital IC |
Keyword(5) | Small size probe |
1st Author's Name | Satoshi Kazama |
1st Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd.() |
2nd Author's Name | Shinichi Shinohara |
2nd Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
3rd Author's Name | Risaburo Sato |
3rd Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
Date | 1999/4/22 |
Paper # | EMCJ99-5 |
Volume (vol) | vol.99 |
Number (no) | 18 |
Page | pp.pp.- |
#Pages | 6 |
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