Presentation | 1994/10/21 A noise measurement of static induction transistor for low power communication (part3) : A measurement of low frequency noise Keiichi Itoh, Hiroshi Inoue, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A measurement of noise in the range of 300Hz to 1MHz of static induction transistor for low power communication is reported. Results of a measurement indicate as follows:(1)Dependancy on drain current is observed in flat noise region,but not observed in 1, f noise region.(2)The larger the product of the source length by the source number,the higher crossover frequency shift.It is considered flat noise is dominantly influenced by the thermal noise in the channel,but 1/f noise might have another noise source which is little infuenced by the thermal noise in the channel. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | SIT / 1/ noise / flat noise / crossover frequency |
Paper # | EMCJ94-43,MW94-67 |
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Committee | EMCJ |
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Conference Date | 1994/10/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A noise measurement of static induction transistor for low power communication (part3) : A measurement of low frequency noise |
Sub Title (in English) | |
Keyword(1) | SIT |
Keyword(2) | 1/ noise |
Keyword(3) | flat noise |
Keyword(4) | crossover frequency |
1st Author's Name | Keiichi Itoh |
1st Author's Affiliation | Department of Electric and Electronic Engineering,Mining College, Akita University() |
2nd Author's Name | Hiroshi Inoue |
2nd Author's Affiliation | Department of Electric and Electronic Engineering,Mining College, Akita University |
Date | 1994/10/21 |
Paper # | EMCJ94-43,MW94-67 |
Volume (vol) | vol.94 |
Number (no) | 302 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |