Presentation 1994/7/7
A New Method of Measuring Dielectric Constant using Forced Resonance
Ki-Chai Kim, Shinobu Tokumaru,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper presents the new method of measuring dielectric constant of dielectric materials.The method of measurements described is using the forced resonance of an electrically small cavity with connect adjustable reactance.The method of moments with Galerkin′s procedure is used to determine the dielectric cons tant.The results show that the dielectric constant are obtained simply by the adjusted reactance.To verify the theoretical analysis,the length of external reactance for the operating frequencies are measured.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Dielectric Constant measurement / Small cavity / Forced resonance / External reactance
Paper # EMCJ94-20
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Conference Information
Committee EMCJ
Conference Date 1994/7/7(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A New Method of Measuring Dielectric Constant using Forced Resonance
Sub Title (in English)
Keyword(1) Dielectric Constant measurement
Keyword(2) Small cavity
Keyword(3) Forced resonance
Keyword(4) External reactance
1st Author's Name Ki-Chai Kim
1st Author's Affiliation Fukuoka Institute of Technology()
2nd Author's Name Shinobu Tokumaru
2nd Author's Affiliation Keio University
Date 1994/7/7
Paper # EMCJ94-20
Volume (vol) vol.94
Number (no) 131
Page pp.pp.-
#Pages 8
Date of Issue