| Presentation | 1994/7/7 A New Method of Measuring Dielectric Constant using Forced Resonance Ki-Chai Kim, Shinobu Tokumaru, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents the new method of measuring dielectric constant of dielectric materials.The method of measurements described is using the forced resonance of an electrically small cavity with connect adjustable reactance.The method of moments with Galerkin′s procedure is used to determine the dielectric cons tant.The results show that the dielectric constant are obtained simply by the adjusted reactance.To verify the theoretical analysis,the length of external reactance for the operating frequencies are measured. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Dielectric Constant measurement / Small cavity / Forced resonance / External reactance |
| Paper # | EMCJ94-20 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 1994/7/7(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Assistant | |
| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A New Method of Measuring Dielectric Constant using Forced Resonance |
| Sub Title (in English) | |
| Keyword(1) | Dielectric Constant measurement |
| Keyword(2) | Small cavity |
| Keyword(3) | Forced resonance |
| Keyword(4) | External reactance |
| 1st Author's Name | Ki-Chai Kim |
| 1st Author's Affiliation | Fukuoka Institute of Technology() |
| 2nd Author's Name | Shinobu Tokumaru |
| 2nd Author's Affiliation | Keio University |
| Date | 1994/7/7 |
| Paper # | EMCJ94-20 |
| Volume (vol) | vol.94 |
| Number (no) | 131 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |