| Presentation | 1999/3/16 A New Behavioral Model of LSI at Power Supply Terminal for EMI Simulation Hitoshi IRINO, Hiroshi WABUKA, Hirokazu TOHYA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A current in a printed circuit board (PCB) power supply line contains radio frequency (RF) currents corresponding to all internal LSI circuit currents. Then, it is necessary for estimating the power supply current to use an appropriate model for LSI power supply terminals. In this report, a new LSI model for the power power supply terminal is proposed, which is a component whose resistance varies with time. Current in the power supply line of a PCB was well simulated by using the model. The maximum deviation between simulated values of current spectra and the measured in experiments was found to be within 10dB in the range of 1MHz to 1GHz. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | RF current / simulation / LSI model at power supply terminal |
| Paper # | EMCJ98-106 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 1999/3/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A New Behavioral Model of LSI at Power Supply Terminal for EMI Simulation |
| Sub Title (in English) | |
| Keyword(1) | RF current |
| Keyword(2) | simulation |
| Keyword(3) | LSI model at power supply terminal |
| 1st Author's Name | Hitoshi IRINO |
| 1st Author's Affiliation | Device Analysis Technology Laboratories, NEC Corporation() |
| 2nd Author's Name | Hiroshi WABUKA |
| 2nd Author's Affiliation | Device Analysis Technology Laboratories, NEC Corporation |
| 3rd Author's Name | Hirokazu TOHYA |
| 3rd Author's Affiliation | Device Analysis Technology Laboratories, NEC Corporation |
| Date | 1999/3/16 |
| Paper # | EMCJ98-106 |
| Volume (vol) | vol.98 |
| Number (no) | 661 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |