Presentation 1999/1/20
Properties and calibaration of the multilayered magnetic field probe
Naoya TAMAKI, Norio MASUDA, Hirokazu TOHYA, Kazuyoshi ISHIZAKA, Masahiro YAMAGUCHI, Ken-ichi ARAI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The antenna factor and several properties of the multilayer board-type magnetic field probe(loop size:0.2mm×8.4mm)with shielded loop structure developed for measuring the magnetic fields near a PCB and an LSI are reported. The amplitude and the phase of the frequency characteristics are linear in the range below 1GHz. And the measurement error about the location of this probe to a trace is evaluated. The complex antenna factor is derived by using the TEM cell or the microstrip line as the magnetic field source, and the results by two methods agree well. The scatter in the antenna factors of products is measured by the TEM cell, which is less than 1.0dB including the measurement error.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) PCB / LSI / shielded loop / multilayer board-trpe magnetic field probe / TEM cell / complex antenna factor
Paper # EMCJ98-103
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Conference Information
Committee EMCJ
Conference Date 1999/1/20(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Properties and calibaration of the multilayered magnetic field probe
Sub Title (in English)
Keyword(1) PCB
Keyword(2) LSI
Keyword(3) shielded loop
Keyword(4) multilayer board-trpe magnetic field probe
Keyword(5) TEM cell
Keyword(6) complex antenna factor
1st Author's Name Naoya TAMAKI
1st Author's Affiliation Device Analysis Technology Laboratories, NEC Corporation()
2nd Author's Name Norio MASUDA
2nd Author's Affiliation Device Analysis Technology Laboratories, NEC Corporation
3rd Author's Name Hirokazu TOHYA
3rd Author's Affiliation Device Analysis Technology Laboratories, NEC Corporation
4th Author's Name Kazuyoshi ISHIZAKA
4th Author's Affiliation IC Department, NEC Glass Component Co.Ltd.
5th Author's Name Masahiro YAMAGUCHI
5th Author's Affiliation Research Institute of Electrical Communication, Tohoku University
6th Author's Name Ken-ichi ARAI
6th Author's Affiliation Research Institute of Electrical Communication, Tohoku University
Date 1999/1/20
Paper # EMCJ98-103
Volume (vol) vol.98
Number (no) 511
Page pp.pp.-
#Pages 7
Date of Issue