Presentation | 1999/1/20 Properties and calibaration of the multilayered magnetic field probe Naoya TAMAKI, Norio MASUDA, Hirokazu TOHYA, Kazuyoshi ISHIZAKA, Masahiro YAMAGUCHI, Ken-ichi ARAI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The antenna factor and several properties of the multilayer board-type magnetic field probe(loop size:0.2mm×8.4mm)with shielded loop structure developed for measuring the magnetic fields near a PCB and an LSI are reported. The amplitude and the phase of the frequency characteristics are linear in the range below 1GHz. And the measurement error about the location of this probe to a trace is evaluated. The complex antenna factor is derived by using the TEM cell or the microstrip line as the magnetic field source, and the results by two methods agree well. The scatter in the antenna factors of products is measured by the TEM cell, which is less than 1.0dB including the measurement error. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | PCB / LSI / shielded loop / multilayer board-trpe magnetic field probe / TEM cell / complex antenna factor |
Paper # | EMCJ98-103 |
Date of Issue |
Conference Information | |
Committee | EMCJ |
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Conference Date | 1999/1/20(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
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Assistant |
Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Properties and calibaration of the multilayered magnetic field probe |
Sub Title (in English) | |
Keyword(1) | PCB |
Keyword(2) | LSI |
Keyword(3) | shielded loop |
Keyword(4) | multilayer board-trpe magnetic field probe |
Keyword(5) | TEM cell |
Keyword(6) | complex antenna factor |
1st Author's Name | Naoya TAMAKI |
1st Author's Affiliation | Device Analysis Technology Laboratories, NEC Corporation() |
2nd Author's Name | Norio MASUDA |
2nd Author's Affiliation | Device Analysis Technology Laboratories, NEC Corporation |
3rd Author's Name | Hirokazu TOHYA |
3rd Author's Affiliation | Device Analysis Technology Laboratories, NEC Corporation |
4th Author's Name | Kazuyoshi ISHIZAKA |
4th Author's Affiliation | IC Department, NEC Glass Component Co.Ltd. |
5th Author's Name | Masahiro YAMAGUCHI |
5th Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
6th Author's Name | Ken-ichi ARAI |
6th Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
Date | 1999/1/20 |
Paper # | EMCJ98-103 |
Volume (vol) | vol.98 |
Number (no) | 511 |
Page | pp.pp.- |
#Pages | 7 |
Date of Issue |