Presentation 1999/1/20
A Course of Error factors at EMI measurement : Study in the instability factor of EMI measurement system
Atsushi Shinozaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We conducted a research to clarify the probable cause of the measurement errs. We found that, when a range of broad band noise is measured using a receiver and spectrum analyzer which conform to the CISPR 16 standard, the measurement errs between the QP(quasi-peak)values can reach up to 8dB at the radiated emission noise tests, and reach more than 30dB at the conducted emission noise tests. we propose to revive the once-available CISPR 16 document for current use, as this document described that, in case of a doubt, the value at the receiver side should have the priority. We also found that, at a specific frequency range, the signal transfer line of the measuring system indicated loss of about 10dB, just because of an incomplete contact at the coaxial connection switch. Similarly, we encountered a phenomena that the antenna factor suddenly changes and its cause was found to be an incomplete contact a single element. In order to prevent occurrences of these measurement errs, it is necessary to confirm the transmission loss and reception sensitivity for the whole frequency range prior to a test.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMI measurement / measurement correlation / measurement err
Paper # EMCJ98-97
Date of Issue

Conference Information
Committee EMCJ
Conference Date 1999/1/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
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Topics (in English)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Course of Error factors at EMI measurement : Study in the instability factor of EMI measurement system
Sub Title (in English)
Keyword(1) EMI measurement
Keyword(2) measurement correlation
Keyword(3) measurement err
1st Author's Name Atsushi Shinozaki
1st Author's Affiliation SEIKO EPSON Corporation()
Date 1999/1/20
Paper # EMCJ98-97
Volume (vol) vol.98
Number (no) 511
Page pp.pp.-
#Pages 6
Date of Issue