Presentation | 1998/10/15 Practical system locating malfunctioning circuit of electronic equipment Takeshi Ishida, Tsugio Eguchi, Hiroshi Onomae, Hiromasa Itoh, Yohji Nagasawa, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Generally Electronic equipment malfunction cause sensitive electro-magnetic noise on printed circuit board. This system asist locating malfunction area of printed circuit board. We reserch or evaluate most suitable noise source and radiation probe. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Immunity / Printed circuit board / Malfunction / Radiation probe / Impulse noise |
Paper # | EMCJ98-58,MW98-97 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 1998/10/15(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Practical system locating malfunctioning circuit of electronic equipment |
Sub Title (in English) | |
Keyword(1) | Immunity |
Keyword(2) | Printed circuit board |
Keyword(3) | Malfunction |
Keyword(4) | Radiation probe |
Keyword(5) | Impulse noise |
1st Author's Name | Takeshi Ishida |
1st Author's Affiliation | Noise Laboratory() |
2nd Author's Name | Tsugio Eguchi |
2nd Author's Affiliation | Noise Laboratory |
3rd Author's Name | Hiroshi Onomae |
3rd Author's Affiliation | Kagoshima Prefectural Institute of Industrial tecnology |
4th Author's Name | Hiromasa Itoh |
4th Author's Affiliation | Kagoshima Prefectural Institute of Industrial tecnology |
5th Author's Name | Yohji Nagasawa |
5th Author's Affiliation | Faculty of engineering Kagoshima University |
Date | 1998/10/15 |
Paper # | EMCJ98-58,MW98-97 |
Volume (vol) | vol.98 |
Number (no) | 324 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |