Presentation 1998/10/15
Practical system locating malfunctioning circuit of electronic equipment
Takeshi Ishida, Tsugio Eguchi, Hiroshi Onomae, Hiromasa Itoh, Yohji Nagasawa,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Generally Electronic equipment malfunction cause sensitive electro-magnetic noise on printed circuit board. This system asist locating malfunction area of printed circuit board. We reserch or evaluate most suitable noise source and radiation probe.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Immunity / Printed circuit board / Malfunction / Radiation probe / Impulse noise
Paper # EMCJ98-58,MW98-97
Date of Issue

Conference Information
Committee EMCJ
Conference Date 1998/10/15(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Practical system locating malfunctioning circuit of electronic equipment
Sub Title (in English)
Keyword(1) Immunity
Keyword(2) Printed circuit board
Keyword(3) Malfunction
Keyword(4) Radiation probe
Keyword(5) Impulse noise
1st Author's Name Takeshi Ishida
1st Author's Affiliation Noise Laboratory()
2nd Author's Name Tsugio Eguchi
2nd Author's Affiliation Noise Laboratory
3rd Author's Name Hiroshi Onomae
3rd Author's Affiliation Kagoshima Prefectural Institute of Industrial tecnology
4th Author's Name Hiromasa Itoh
4th Author's Affiliation Kagoshima Prefectural Institute of Industrial tecnology
5th Author's Name Yohji Nagasawa
5th Author's Affiliation Faculty of engineering Kagoshima University
Date 1998/10/15
Paper # EMCJ98-58,MW98-97
Volume (vol) vol.98
Number (no) 324
Page pp.pp.-
#Pages 6
Date of Issue