| Presentation | 1995/7/20 On the Method for Measuring Complex Dielectric Constant using Small Cavity with External Element Ki-Chai Kim, Kazunori Uchida, Shinobu Tokumaru, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents the method for measuring complex dielectric constants of dielectric materials from measured driving point impedances. The proposed method is to use a input impedance of a electrically small cavity and a external element used for a sensitivity control. The method of moments with Galerkin's procedure is used to determine the input impedance of the cavity. In this paper, Muller method is used to find the complex dielectric constant from the measured driving point impedance as the inverse algorithm. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Dielectric constant / Small cavity / External reactance / Driving point impedance |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 1995/7/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On the Method for Measuring Complex Dielectric Constant using Small Cavity with External Element |
| Sub Title (in English) | |
| Keyword(1) | Dielectric constant |
| Keyword(2) | Small cavity |
| Keyword(3) | External reactance |
| Keyword(4) | Driving point impedance |
| 1st Author's Name | Ki-Chai Kim |
| 1st Author's Affiliation | Fukuoka Institute of Technology() |
| 2nd Author's Name | Kazunori Uchida |
| 2nd Author's Affiliation | Fukuoka Institute of Technology |
| 3rd Author's Name | Shinobu Tokumaru |
| 3rd Author's Affiliation | Keio University |
| Date | 1995/7/20 |
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| Volume (vol) | vol.95 |
| Number (no) | 154 |
| Page | pp.pp.- |
| #Pages | 7 |
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