Presentation 1995/4/18
On the Method for Measuring Complex Dielectric Constants by Forced Resonance
Ki-Chai Kim, Kazunori Uchida, Shinobu Tokumaru,
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Abstract(in English) This paper presents a new method for measuring complex permittivity. The idea is using the forced resonances of an electrically small cavity filled with the dielectric specimen. The forced resonance, series or parallel resonances, can be obtained by controlling the external reactance. The method of moments with Galerkin's procedure is used to determine the complex dielectric constant. Numerical results show that the complex permittivity are determined simply using the series and parallel resonances simultaneously. To verify the usefulness of the method, experimental results are compared with theoretical ones.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Measurement of complex permittivity / Small cavity / Forced resonance
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Conference Information
Committee EMCJ
Conference Date 1995/4/18(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On the Method for Measuring Complex Dielectric Constants by Forced Resonance
Sub Title (in English)
Keyword(1) Measurement of complex permittivity
Keyword(2) Small cavity
Keyword(3) Forced resonance
1st Author's Name Ki-Chai Kim
1st Author's Affiliation Fukuoka Institute of Technology()
2nd Author's Name Kazunori Uchida
2nd Author's Affiliation Fukuoka Institute of Technology
3rd Author's Name Shinobu Tokumaru
3rd Author's Affiliation Keio University
Date 1995/4/18
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Volume (vol) vol.95
Number (no) 4
Page pp.pp.-
#Pages 6
Date of Issue