Presentation | 1995/4/18 On the Method for Measuring Complex Dielectric Constants by Forced Resonance Ki-Chai Kim, Kazunori Uchida, Shinobu Tokumaru, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper presents a new method for measuring complex permittivity. The idea is using the forced resonances of an electrically small cavity filled with the dielectric specimen. The forced resonance, series or parallel resonances, can be obtained by controlling the external reactance. The method of moments with Galerkin's procedure is used to determine the complex dielectric constant. Numerical results show that the complex permittivity are determined simply using the series and parallel resonances simultaneously. To verify the usefulness of the method, experimental results are compared with theoretical ones. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Measurement of complex permittivity / Small cavity / Forced resonance |
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Committee | EMCJ |
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Conference Date | 1995/4/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | On the Method for Measuring Complex Dielectric Constants by Forced Resonance |
Sub Title (in English) | |
Keyword(1) | Measurement of complex permittivity |
Keyword(2) | Small cavity |
Keyword(3) | Forced resonance |
1st Author's Name | Ki-Chai Kim |
1st Author's Affiliation | Fukuoka Institute of Technology() |
2nd Author's Name | Kazunori Uchida |
2nd Author's Affiliation | Fukuoka Institute of Technology |
3rd Author's Name | Shinobu Tokumaru |
3rd Author's Affiliation | Keio University |
Date | 1995/4/18 |
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Volume (vol) | vol.95 |
Number (no) | 4 |
Page | pp.pp.- |
#Pages | 6 |
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