Presentation 1997/1/24
Basic Study of Application of a Near Field Antenna Measurement to a EMI Measurement
Takeshi UCHIDA, Yoshihiko KONISHI, Naoto OKA, Shuji URASAKI,
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Abstract(in English) We know two Antenna radiation pattern measurement, "Near Field Far Field Antenna Measurement" and "A Far-Field Radiation Pattern Measurement for Eliminating Residual Reflection by Distance Changing". We'll examine a Radiated EMI Measurement by combing these two methods, which calculate a radiated EMI value at semi-anechoic chamber from measurement pattern at arbitrary place. In this paper, we test this method with L-band standard gain horn antenna, compare a measurement value and calculated value. And we confirmed that measurement value and calculate value with white noise in the semi-anechoic chamber are corresponding
Keyword(in Japanese) (See Japanese page)
Keyword(in English) emi measurement / Near field far field antenna measurement
Paper # EMCJ96-64
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Committee EMCJ
Conference Date 1997/1/24(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Basic Study of Application of a Near Field Antenna Measurement to a EMI Measurement
Sub Title (in English)
Keyword(1) emi measurement
Keyword(2) Near field far field antenna measurement
1st Author's Name Takeshi UCHIDA
1st Author's Affiliation Mitsubishi Electric Corp. Information Technology R&D Center()
2nd Author's Name Yoshihiko KONISHI
2nd Author's Affiliation Mitsubishi Electric Corp. Information Technology R&D Center
3rd Author's Name Naoto OKA
3rd Author's Affiliation Mitsubishi Electric Corp. Information Technology R&D Center
4th Author's Name Shuji URASAKI
4th Author's Affiliation Mitsubishi Electric Corp. Information Technology R&D Center
Date 1997/1/24
Paper # EMCJ96-64
Volume (vol) vol.96
Number (no) 495
Page pp.pp.-
#Pages 8
Date of Issue