| Presentation | 1996/12/21 A method to detect a malfunction place of PCBs by ESD simulater Hiroshi ONOMAE, Yoji NAGASAWA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper is discribed the Immunity evaluation system to analyze a malfunction distribution of PCBs by a local electro static discharge. A malfunction distribution is displayed on a picture of PCBs by 6 phased color and a voltage and malfunction discrimination code. It can detect a malfunction place being efficient by changing an electric discharge range. Incase of an experimental PCBs, reset patterns of CPU were detected as a place to be able easily to do a malfunction. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ESD / immunity / printed circuit board / malfunction |
| Paper # | EMCJ96-48 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 1996/12/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A method to detect a malfunction place of PCBs by ESD simulater |
| Sub Title (in English) | |
| Keyword(1) | ESD |
| Keyword(2) | immunity |
| Keyword(3) | printed circuit board |
| Keyword(4) | malfunction |
| 1st Author's Name | Hiroshi ONOMAE |
| 1st Author's Affiliation | Kagoshima Prefectural Institute of Industrial tecnology() |
| 2nd Author's Name | Yoji NAGASAWA |
| 2nd Author's Affiliation | Faculty of engineering, Kagoshima University |
| Date | 1996/12/21 |
| Paper # | EMCJ96-48 |
| Volume (vol) | vol.96 |
| Number (no) | 441 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |