Presentation 1998/3/16
A Study of Simplified E-Field Measurement inside the Dry Phantom Model
Shinichiro NISHIZAWA, Osamu HASHIMOTO, Tatsuro OOI,
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Abstract(in English) In this paper, the E-field inside the dry cylindrical phantom model by near and far field exposure, is measured by using the fabricated dipole probe, which can receive the extremly low-level. Additionally, the influence of the insertion hole, which is made to the dry phantom model, is investigated and the error caused by the insertion hole is analyzed by using that Finite Difference Time Domain (FDTD) method. The validity of the measured result, which is corrected with the error of insertion hole, is verified by comparing with the calculated results by FDTD.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Dry cylindrical phantom / Near-field exposure / Far-field exposure, Simplified e-field measurement / FDTD
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Conference Information
Committee EMCJ
Conference Date 1998/3/16(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study of Simplified E-Field Measurement inside the Dry Phantom Model
Sub Title (in English)
Keyword(1) Dry cylindrical phantom
Keyword(2) Near-field exposure
Keyword(3) Far-field exposure, Simplified e-field measurement
Keyword(4) FDTD
1st Author's Name Shinichiro NISHIZAWA
1st Author's Affiliation Graduats School of Science and Engineering Aoyama Gakuin University()
2nd Author's Name Osamu HASHIMOTO
2nd Author's Affiliation Graduats School of Science and Engineering Aoyama Gakuin University
3rd Author's Name Tatsuro OOI
3rd Author's Affiliation Graduats School of Science and Engineering Aoyama Gakuin University
Date 1998/3/16
Paper #
Volume (vol) vol.97
Number (no) 608
Page pp.pp.-
#Pages 7
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