| Presentation | 1997/10/27 Disturbance Measurement Using Wide Band APD Measuring Equipment Masaharu UCHINO, Yoshinobu HAYASHI, Takashi SHINOZUKA, Risaburo SATO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | An APD (Amplitude Probability Distribution) measuring equipment has been developed that can perform high-speed measurement of amplitude distribution by combining multiple M-sequence counters having relatively prime cycles and by using residue number systems. Moreover, by using a wideband APD measuring equipment that combines this developed equipment with a high-speed logarithmic amplifier having a reception bandwidth of 500MHz, T_r=10nsec, T_f=30nsec, APD of disturbance leaked from a microwave oven and of disturbance from electrostatic discharge were measured in a semicontinuous manner over a long time period at a bandwidth of 100MHz. At the same time, the video output from a spectrum analyzer used for standard disturbance measurements was connected to the APD measuring equipment and APD measurements with video output were performed under a resolution bandwidth of 1MHz. Finally, with regard to disturbance from a microwave oven, two sets of a spectrum analyzer and APD measuring equipment combination were used as proposed by CISPR to perform weighting measurements (10Hz video bandwidth) simultaneously with APD measurements having a 3MHz video bandwidth. the measurement data so obtained are examined and compared and results are presented. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | amplitude probability distribution / EMC / micro wave oven / disturbance / M-sequence / residue number system |
| Paper # | EMCJ97-57 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 1997/10/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Disturbance Measurement Using Wide Band APD Measuring Equipment |
| Sub Title (in English) | |
| Keyword(1) | amplitude probability distribution |
| Keyword(2) | EMC |
| Keyword(3) | micro wave oven |
| Keyword(4) | disturbance |
| Keyword(5) | M-sequence |
| Keyword(6) | residue number system |
| 1st Author's Name | Masaharu UCHINO |
| 1st Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd.() |
| 2nd Author's Name | Yoshinobu HAYASHI |
| 2nd Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
| 3rd Author's Name | Takashi SHINOZUKA |
| 3rd Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
| 4th Author's Name | Risaburo SATO |
| 4th Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
| Date | 1997/10/27 |
| Paper # | EMCJ97-57 |
| Volume (vol) | vol.97 |
| Number (no) | 341 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |