| Presentation | 2002/9/13 The trend of IEC dependability standards : reliability test methods and test examples Naoki KURIHARA, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | R2002-25 |
| Date of Issue |
| Conference Information | |
| Committee | R |
|---|---|
| Conference Date | 2002/9/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Reliability(R) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | The trend of IEC dependability standards : reliability test methods and test examples |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Naoki KURIHARA |
| 1st Author's Affiliation | Reliability Center for Electronic components of Japan Environmental Testing Laboratory() |
| Date | 2002/9/13 |
| Paper # | R2002-25 |
| Volume (vol) | vol.102 |
| Number (no) | 321 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |