Presentation 2001/9/7
A result example of radioactive rays tolerance for Semiconductor Device : Use of COTS Parts
Masahito KAJINUMA, Naonobu FUJIMOTO, Akira MIZOGUCHI,
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Abstract(in English) Parts user accelerates COTS parts use, because currently they cannot buy a MIL specification parts, In Commercial grade parts, the progress of semiconductor devises technology is very fast. Therefor various field engineers discuss a use of COTS parts for defense and aerospace products, because this use will make products small and high performance. However, as using COTS parts for high reliability products, user has to get reliability data of COTS parts by oneself. Parts vender does not have a data of radioactive rays tolerance. Therefor, devise user must get this data by oneself. We report acquired characteristics of radioactive rays tolerance of two multi function devise, FPGA and 32bit MPU.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) COTS / Single Event Effect / Total Dose / Commercial Grade Parts
Paper # R2001-16
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Committee R
Conference Date 2001/9/7(1days)
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Registration To Reliability(R)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A result example of radioactive rays tolerance for Semiconductor Device : Use of COTS Parts
Sub Title (in English)
Keyword(1) COTS
Keyword(2) Single Event Effect
Keyword(3) Total Dose
Keyword(4) Commercial Grade Parts
1st Author's Name Masahito KAJINUMA
1st Author's Affiliation Quality Assurance Section MITUBISHI ELECTRIC Cooperation Kamakura Works()
2nd Author's Name Naonobu FUJIMOTO
2nd Author's Affiliation Quality Assurance Section MITUBISHI ELECTRIC Cooperation Kamakura Works
3rd Author's Name Akira MIZOGUCHI
3rd Author's Affiliation Quality Assurance Section MITUBISHI ELECTRIC Cooperation Kamakura Works
Date 2001/9/7
Paper # R2001-16
Volume (vol) vol.101
Number (no) 305
Page pp.pp.-
#Pages 3
Date of Issue