| Presentation | 2001/5/18 A Generalized Software Reability Growth Modeling with Testing-Domain: Model and Application Takaji Fujiwara, Shigeru Yamada, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The set of modules and functions in the software system, which is influenced by the executed test-cases, is called a testing-domain, and it spreads with the progress of testing. In this paper, we propose a testing-domaim dependent software reliability growth model considering the skill-factor of test-case designers where it is assumed that the fault-detection possibility growth rate and the testing-domain growth rate are not equivalent in the fault-detection process. This model based on a nonhomogeneous Poisson process is defined as a generalized testing-domain dependent software reliability growth model which improves the conventional model in terms of goodness-of-fit. Further, using several evaluation criteria, we discuss its goodness-of-fit for several actual data sets in comparison with the conventional model. Finally, numerical illustrations of software reliability assessment are shown. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | software reliability assessment / reliability growth model / testing-skill / testing-domain / fault-detection possibility |
| Paper # | R2001-8 |
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| Committee | R |
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| Conference Date | 2001/5/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Reliability(R) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Generalized Software Reability Growth Modeling with Testing-Domain: Model and Application |
| Sub Title (in English) | |
| Keyword(1) | software reliability assessment |
| Keyword(2) | reliability growth model |
| Keyword(3) | testing-skill |
| Keyword(4) | testing-domain |
| Keyword(5) | fault-detection possibility |
| 1st Author's Name | Takaji Fujiwara |
| 1st Author's Affiliation | Department of First Development, Division II, Fujitsu Peripherals Limited() |
| 2nd Author's Name | Shigeru Yamada |
| 2nd Author's Affiliation | Department of Social Systems Engineering, Faculty of Engineering, Tottori University |
| Date | 2001/5/18 |
| Paper # | R2001-8 |
| Volume (vol) | vol.101 |
| Number (no) | 88 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |