Presentation 2001/5/18
State-Transition Diagram Analyses of the Risk-Reduction Made by Automatic Diagnoses
Takuya Kawahara, Akihiro Ichitsuka, Yoshinobu Sato,
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Abstract(in English) It is often misunderstood that the automatic diagnoses reduce the frequency of the hazardous event down to the negligible degree compared to those caused by undetected-failures. However, the result obtained here indicates it is not always true. This agrees well with those obtained previously from the Sequential Failure Logic. There are cases where frequencies of the hazardous events brought about by detected-failures exceed those caused by undetected-failures, as far as EUC is not shut down after the detection of failures. This fact becomes clear with the increasing demand rate and the diagnostic coverage. Thus, the new models proposed here are important for those systems.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) IEC 61508 / Safety related system / Automatic diagnosis / State-Transition Diagram
Paper # R2001-3
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Committee R
Conference Date 2001/5/18(1days)
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Registration To Reliability(R)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) State-Transition Diagram Analyses of the Risk-Reduction Made by Automatic Diagnoses
Sub Title (in English)
Keyword(1) IEC 61508
Keyword(2) Safety related system
Keyword(3) Automatic diagnosis
Keyword(4) State-Transition Diagram
1st Author's Name Takuya Kawahara
1st Author's Affiliation Toshiba Advanced Systems Corporation()
2nd Author's Name Akihiro Ichitsuka
2nd Author's Affiliation Toshiba Advanced Systems Corporation
3rd Author's Name Yoshinobu Sato
3rd Author's Affiliation Tokyo University of Mercantile Marine
Date 2001/5/18
Paper # R2001-3
Volume (vol) vol.101
Number (no) 88
Page pp.pp.-
#Pages 6
Date of Issue