| Presentation | 2000/11/10 Failure analysis system using extraction of killer function failure that has impact on yield Fumihito Ohta, Yasukazu Mukogawa, Kouji Fukumoto, Youji Mashiko, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Memory devices have redundant circuits. Part of the failures can be repaired within the range of the ability to replace redundant circuits. We have developed the failure analysis system using automatic extraction of the killer function failure that has an impact on yield of memory devices. In this system, all failures can be separated into the killer function failures that cannot be repaired and the others. Applying this system to the 64Mbits memory, we confirmed that the rate of each killer function failure mode could be estimated. Therefore, we have established the effective system for failure analysis of memory devices. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | yield / memory device / killer function failure / redundant circuit / fail bit map |
| Paper # | R2000-24 |
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| Conference Information | |
| Committee | R |
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| Conference Date | 2000/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Reliability(R) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Failure analysis system using extraction of killer function failure that has impact on yield |
| Sub Title (in English) | |
| Keyword(1) | yield |
| Keyword(2) | memory device |
| Keyword(3) | killer function failure |
| Keyword(4) | redundant circuit |
| Keyword(5) | fail bit map |
| 1st Author's Name | Fumihito Ohta |
| 1st Author's Affiliation | ULSI Development Center, Evaluation & Analysis Department, Mitsubishi Electric Corporation() |
| 2nd Author's Name | Yasukazu Mukogawa |
| 2nd Author's Affiliation | ULSI Development Center, Evaluation & Analysis Department, Mitsubishi Electric Corporation |
| 3rd Author's Name | Kouji Fukumoto |
| 3rd Author's Affiliation | ULSI Development Center, Evaluation & Analysis Department, Mitsubishi Electric Corporation |
| 4th Author's Name | Youji Mashiko |
| 4th Author's Affiliation | ULSI Development Center, Evaluation & Analysis Department, Mitsubishi Electric Corporation |
| Date | 2000/11/10 |
| Paper # | R2000-24 |
| Volume (vol) | vol.100 |
| Number (no) | 445 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |