| Presentation | 2000/10/13 Failure Analysis of Electronic Components Using X-ray CT Scanner Yoshiyuki Ihara, Kyouiti Tokunaga, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Presently, surface mounting methods are used for most electronic equipment and the majority of electronic components and material are surfce mounted types. Advances in the miniaturization of hese components and packages has for exceeded expectations. The writer and others clearly demonstrated the effectiveness of using an X-ray CT scanner, a non-destructive anaalyze components using this equipment, to make an failure analysis of electronic components. Since then, they have continued to analyze components using this equipment and have studied its effectiveness as non-destructive analysis methods. This report especially presents new approach of reliability test by the combination of life test and X-ray CT scanner failure analysis performance by the three-dimentionnal obsevbation of defect parts. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Failure Analysis / X-ray CT / Surface Mount Device / Chip Size Package / Solder Joint |
| Paper # | R2000-21 |
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| Conference Information | |
| Committee | R |
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| Conference Date | 2000/10/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Reliability(R) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Failure Analysis of Electronic Components Using X-ray CT Scanner |
| Sub Title (in English) | |
| Keyword(1) | Failure Analysis |
| Keyword(2) | X-ray CT |
| Keyword(3) | Surface Mount Device |
| Keyword(4) | Chip Size Package |
| Keyword(5) | Solder Joint |
| 1st Author's Name | Yoshiyuki Ihara |
| 1st Author's Affiliation | NEC Corporation() |
| 2nd Author's Name | Kyouiti Tokunaga |
| 2nd Author's Affiliation | Quality Management Promotion Division, NEC Corporation |
| Date | 2000/10/13 |
| Paper # | R2000-21 |
| Volume (vol) | vol.100 |
| Number (no) | 377 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |