| Presentation | 1995/9/22 The On-Orbit Measurement of Single Event Upset by ETS-VI Satellite Tateo GOKA, Haruhisa MATSUMOTO, Masayuki HIGUCHI, Takashi HADA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The space parts are required high reliability and radiation hardness. Especially memory devices and microprocessors are required immunity from Single Event Upset(SEU). The SEU is one major problem of 3 major spacecraft anomalies by space environments. SEU in-flight measurements are presented on 2 radiation hardened microelectronics, 64kb SRAMs, 8bit microprocessors ( 4kgates gate-array ) in the ETS-VI satellite orbit(8000km-38000km , 13 degrees inclination ). SEU rate prediction using CREME code and ground-testing data are compared |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | SEU / Space Part / Radiation Hardness / Soft Error / Gate Array / Memory Device |
| Paper # | R95-10 |
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| Conference Information | |
| Committee | R |
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| Conference Date | 1995/9/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Reliability(R) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | The On-Orbit Measurement of Single Event Upset by ETS-VI Satellite |
| Sub Title (in English) | |
| Keyword(1) | SEU |
| Keyword(2) | Space Part |
| Keyword(3) | Radiation Hardness |
| Keyword(4) | Soft Error |
| Keyword(5) | Gate Array |
| Keyword(6) | Memory Device |
| 1st Author's Name | Tateo GOKA |
| 1st Author's Affiliation | Office of Reserch and Development, NASDA() |
| 2nd Author's Name | Haruhisa MATSUMOTO |
| 2nd Author's Affiliation | Office of Reserch and Development, NASDA |
| 3rd Author's Name | Masayuki HIGUCHI |
| 3rd Author's Affiliation | Office of Reserch and Development, NASDA |
| 4th Author's Name | Takashi HADA |
| 4th Author's Affiliation | Office of Reserch and Development, NASDA |
| Date | 1995/9/22 |
| Paper # | R95-10 |
| Volume (vol) | vol.95 |
| Number (no) | 257 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |