Presentation 1996/2/16
Optimal Times of Burn-In Tests for Multilevel Assembly Lines
Kodo Ito, Toshio Nakagawa,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Ptoducers must perform a burn-in test of products such as aircraft parts before delivery to eliminate initial failures. However, if the test takes too long, it may cause serious delay in production schedules and sometimes, may raise the cost of the product. Therefore, we have to design optimal bum-in tests by comparing the influence on production activities with the possible damage due to initial failures. This paper considers optimal burn-in policies for multilevel assembly lines, introducing various kinds of cost factors. When the failure times are exponential and Weibull distribution, optimal policies which minimize the expected cost rate are discussed. Numerical examples are finally given.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Burn-in / screening / initial failure / assembly line / exponential distribution / Weibull distribution
Paper # R95-49,EMD95-80
Date of Issue

Conference Information
Committee R
Conference Date 1996/2/16(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Reliability(R)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optimal Times of Burn-In Tests for Multilevel Assembly Lines
Sub Title (in English)
Keyword(1) Burn-in
Keyword(2) screening
Keyword(3) initial failure
Keyword(4) assembly line
Keyword(5) exponential distribution
Keyword(6) Weibull distribution
1st Author's Name Kodo Ito
1st Author's Affiliation No. 1 Missile Designing Section, Missile & Electronics Department,Nagoya Guidance and Propulsion Systems Works,Mitsubishi Heavy Industries, LTD.()
2nd Author's Name Toshio Nakagawa
2nd Author's Affiliation Department of Industrial Engineering
Date 1996/2/16
Paper # R95-49,EMD95-80
Volume (vol) vol.95
Number (no) 521
Page pp.pp.-
#Pages 6
Date of Issue