Presentation 1995/12/15
Flight Data of Integrated Circuit Monitor (ICM) on ETS-VI Satellite
Yugo KIMOTO, Haruhisa MATSUMOTO, Tateo GOKA, Toshiyuki HUKUDA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper describes the degradation (radiation damage) of six 4007 type devices by total dose effects in the Integrated Circuit Monitor (ICM) on board the Engineering Test Satellite-VI (ETS-VI). The devices are covered with three different thicknesses of aluminum shielding. The on-orbit device performance of the 4007 devices is compared to ^<60>Co ground test data from the same lot devices.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ICM / Radiation damage / Total dose effects / 4007 type device / ETS-VI
Paper # R95-35
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Conference Date 1995/12/15(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Flight Data of Integrated Circuit Monitor (ICM) on ETS-VI Satellite
Sub Title (in English)
Keyword(1) ICM
Keyword(2) Radiation damage
Keyword(3) Total dose effects
Keyword(4) 4007 type device
Keyword(5) ETS-VI
1st Author's Name Yugo KIMOTO
1st Author's Affiliation Office of Research and Development, NASDA()
2nd Author's Name Haruhisa MATSUMOTO
2nd Author's Affiliation Office of Research and Development, NASDA
3rd Author's Name Tateo GOKA
3rd Author's Affiliation Office of Research and Development, NASDA
4th Author's Name Toshiyuki HUKUDA
4th Author's Affiliation Office of Research and Development, NASDA
Date 1995/12/15
Paper # R95-35
Volume (vol) vol.95
Number (no) 432
Page pp.pp.-
#Pages 6
Date of Issue