| Presentation | 1998/3/13 Improvements in the tamper resistance, reliability and endurance of IC cards and methods for evaluating these characteristics Tadao Takeda, Hiroshi Ban, Hideyuki Unno, Masahiko Maeda, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Ic cards for electric commerce are required to perform well and have high tamper resistance because data-encryption for authentication and digital signature should be processed quickly and securely. Both the physical properties of IC cards and endurance test methods for IC cards have already been standardized in ISO, JIS and so on. However, those standards are not good for several kinds of applications like electric money and pre-paid cards. Thererfore, methods for evaluating on IC card's tamper resistance and endurance were developed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | IC card / Tamper resistance / Reliability / Endurance / Electric commerce |
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| Conference Information | |
| Committee | R |
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| Conference Date | 1998/3/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Reliability(R) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvements in the tamper resistance, reliability and endurance of IC cards and methods for evaluating these characteristics |
| Sub Title (in English) | |
| Keyword(1) | IC card |
| Keyword(2) | Tamper resistance |
| Keyword(3) | Reliability |
| Keyword(4) | Endurance |
| Keyword(5) | Electric commerce |
| 1st Author's Name | Tadao Takeda |
| 1st Author's Affiliation | NTT System Electronics Laboratories() |
| 2nd Author's Name | Hiroshi Ban |
| 2nd Author's Affiliation | NTT System Electronics Laboratories |
| 3rd Author's Name | Hideyuki Unno |
| 3rd Author's Affiliation | NTT System Electronics Laboratories |
| 4th Author's Name | Masahiko Maeda |
| 4th Author's Affiliation | NTT System Electronics Laboratories |
| Date | 1998/3/13 |
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| Volume (vol) | vol.97 |
| Number (no) | 600 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |