Presentation	1997/10/30 Reliability Prediction of LSI Technologies Using Statistical Simulation Kazunori HIRAOKA,
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Abstract(in English)	To predict the reliability of LSI chips an exact statistical failure distribution is needed. In this work, computer simulation shows that the failure time distribution of chips is the Weibull distribution over the number of 500 elements contained in a chip, regardless of the kind of failure time distributions of elements. The failure times of chips are proportional to N^<-1/β>, where N is the number of elements and β is the shape parameter of the Weibull distribution. Simple relation between the failure distributions of elements and chips is found out. This paper also describes a procedure for predicting reliability.
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Keyword(in English)	LSI / reliability / failure distribution / reliability prediction / simulation
Paper #	R97-13
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Conference Information
Committee	R
Conference Date	1997/10/30(1days)
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Paper Information
Registration To	Reliability(R)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Reliability Prediction of LSI Technologies Using Statistical Simulation
Sub Title (in English)
Keyword(1)	LSI
Keyword(2)	reliability
Keyword(3)	failure distribution
Keyword(4)	reliability prediction
Keyword(5)	simulation
1st Author's Name	Kazunori HIRAOKA
1st Author's Affiliation	NTT System Electronics Laboratories()
Date	1997/10/30
Paper #	R97-13
Volume (vol)	vol.97
Number (no)	351
Page	pp.pp.-
#Pages	6
Date of Issue