Presentation	1997/3/14 Verification of the efficacy of I_ test as the estimation method for space application Hiroyuki Shindou, Norio Nemoto, Kazuhiro Matsuzaki, Sumio Matsuda, Shinji Baba, Takayuki Hirose,
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Abstract(in English)	It is necessary to obtain the electroniic caracteristic of the semiconductor device in order to estimate the possibility for space use. But it becomes insufficient to use the functional test for this purpose. Recently, I_ test has become increasingly important to compensate for function test. In this paper, we compare the functional test and I_ test, and verify the efficacy of I_ test.
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Keyword(in English)	I_ test / CMOS / SRAM / functional test
Paper #	R96-48,CPM96-157
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Committee	R
Conference Date	1997/3/14(1days)
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Paper Information
Registration To	Reliability(R)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Verification of the efficacy of I_ test as the estimation method for space application
Sub Title (in English)
Keyword(1)	I_ test
Keyword(2)	CMOS
Keyword(3)	SRAM
Keyword(4)	functional test
1st Author's Name	Hiroyuki Shindou
1st Author's Affiliation	National Space Development Agency of Japan()
2nd Author's Name	Norio Nemoto
2nd Author's Affiliation	National Space Development Agency of Japan
3rd Author's Name	Kazuhiro Matsuzaki
3rd Author's Affiliation	National Space Development Agency of Japan
4th Author's Name	Sumio Matsuda
4th Author's Affiliation	National Space Development Agency of Japan
5th Author's Name	Shinji Baba
5th Author's Affiliation	Ryoei Technica Corporation
6th Author's Name	Takayuki Hirose
6th Author's Affiliation	Ryoei Technica Corporation
Date	1997/3/14
Paper #	R96-48,CPM96-157
Volume (vol)	vol.96
Number (no)	574
Page	pp.pp.-
#Pages	6
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