Presentation 2001/9/21
Contact Resistance Performances at Low Temperature
Terutaka Tamai,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) For low temperature applications of electrical contacts such as cryogenics, contact resistance performances must be studied in detail. The cryogenical performances of contact resistance are also important in clarifying basic contact mechanisms and controlling the contact resistance. This paper presents low temperature dependencies of the contact resistance of clean surface, contaminated surface, and an evaluation of true contact area based on the breakdown of super conduction. Regarding the constriction resistance as a function of the temperature, it was found that a singular phenomenon of the constriction resistance on the clean surface occurred. For the contaminated surface, the Schottky conduction was observed at oxide film covered contacts. Furthermore, size of the true contact area at very low temperature could be evaluated by the breakdown of the superconduction caused by self magnetic field of the contact current.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) contact resistance / low temperature / superconduction / Schottky conduction
Paper # EMD2001-65
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Conference Information
Committee EMD
Conference Date 2001/9/21(1days)
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Registration To Electromechanical Devices (EMD)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Contact Resistance Performances at Low Temperature
Sub Title (in English)
Keyword(1) contact resistance
Keyword(2) low temperature
Keyword(3) superconduction
Keyword(4) Schottky conduction
1st Author's Name Terutaka Tamai
1st Author's Affiliation Hyogo University of Teacher Education()
Date 2001/9/21
Paper # EMD2001-65
Volume (vol) vol.101
Number (no) 327
Page pp.pp.-
#Pages 6
Date of Issue