Presentation 2001/9/20
A Review of Volumetric Erosion Studies in Low Voltage Electrical Contacts
J.W. McBride,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper presents a review of volumetric erosion studies applied to electrical contacts. The numerical methods presented are generic and could equally be applied to a number of areas where surfaces have been eroded or damage. Equally there is no scale limitation of the surfaces to which the numerical methods can be applied. The papers starts with a general introduction of the issues associated with the measurement of contact erosion, and then presents a summary of various hardware system for making 3D measurements of surfaces such as electrical contacts. This is followed by a review of the generic form fittingmethods and also volume calculation methods. The paper concludes with a review of results taken from a test system for contact studies and from contact samples taken from commercial relays.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 3D Surface metrology / surface erosion / wear / arc erosion / volumetric erosion
Paper # EMD2001-45
Date of Issue

Conference Information
Committee EMD
Conference Date 2001/9/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electromechanical Devices (EMD)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Review of Volumetric Erosion Studies in Low Voltage Electrical Contacts
Sub Title (in English)
Keyword(1) 3D Surface metrology
Keyword(2) surface erosion
Keyword(3) wear
Keyword(4) arc erosion
Keyword(5) volumetric erosion
1st Author's Name J.W. McBride
1st Author's Affiliation school of Engineering Science University of Southampton()
Date 2001/9/20
Paper # EMD2001-45
Volume (vol) vol.101
Number (no) 326
Page pp.pp.-
#Pages 8
Date of Issue