Presentation | 2001/1/12 Pursuit an ideal linear resistor Isao Minowa, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Nonlinear voltages caused by electromechanical components, resistor, capacitor and metal-semiconductor interface, etc are measured to know their I-V characteristics and also their quality. Various characteristics have been measured by our dual frequency method for contact, tunneling device, etc. For sensitive measurement of device which has little non-linearity, it would be required that a linear resistor for standardization. For the purpose, Quantum Hall Resistance (QHR) measured as resistance standard may be used. Therefore, the linear region of I-V characteristics in a QHR has been studied. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Linear resistor / dual frequency method / quantum Hall resistance |
Paper # | EMD 2000-86 |
Date of Issue |
Conference Information | |
Committee | EMD |
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Conference Date | 2001/1/12(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Pursuit an ideal linear resistor |
Sub Title (in English) | |
Keyword(1) | Linear resistor |
Keyword(2) | dual frequency method |
Keyword(3) | quantum Hall resistance |
1st Author's Name | Isao Minowa |
1st Author's Affiliation | Department of Electronic Engineering, Faculty of Engineering, Tamagawa University() |
Date | 2001/1/12 |
Paper # | EMD 2000-86 |
Volume (vol) | vol.100 |
Number (no) | 567 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |