Presentation 2001/1/12
Pursuit an ideal linear resistor
Isao Minowa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Nonlinear voltages caused by electromechanical components, resistor, capacitor and metal-semiconductor interface, etc are measured to know their I-V characteristics and also their quality. Various characteristics have been measured by our dual frequency method for contact, tunneling device, etc. For sensitive measurement of device which has little non-linearity, it would be required that a linear resistor for standardization. For the purpose, Quantum Hall Resistance (QHR) measured as resistance standard may be used. Therefore, the linear region of I-V characteristics in a QHR has been studied.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Linear resistor / dual frequency method / quantum Hall resistance
Paper # EMD 2000-86
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Conference Information
Committee EMD
Conference Date 2001/1/12(1days)
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Paper Information
Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Pursuit an ideal linear resistor
Sub Title (in English)
Keyword(1) Linear resistor
Keyword(2) dual frequency method
Keyword(3) quantum Hall resistance
1st Author's Name Isao Minowa
1st Author's Affiliation Department of Electronic Engineering, Faculty of Engineering, Tamagawa University()
Date 2001/1/12
Paper # EMD 2000-86
Volume (vol) vol.100
Number (no) 567
Page pp.pp.-
#Pages 6
Date of Issue