Presentation 2000/12/8
Observation of the Contact Damage of AgCd and AgSn Compounds by Breaking Arc at Small Operation Numbers
Hiroshi INOUE, Yuki TAKAHASHI, Gaku YAMAMOTO,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) For the basic research of the evaluations of material properties, which are practically used for current switches with breaking arc dischrge, the discharge mark whose area is surface damage of contact by breaking arc discharge, are observed using SEM, and its area in the image is estimated. In this report, five kinds of contact materials, Ag and Ag compounds with Cd and Sn are used at the conditions of 40V of open voltage, 4A of close current and 10mm/s of opening velocity. Estimation of the electrode damage are performed opening motion number of one, ten, fifty and one hundred times. The surface of those contact materials both anode side and cathode side observed by SEM, and each discharge mark areas were measured. In result, characteristic of each contact material, and characteristic of anode side and cathode side were observed clearly.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Ag compound materials / breaking arc discharge / contact damage / discharge mark
Paper # EMD2000-82
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Committee EMD
Conference Date 2000/12/8(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Observation of the Contact Damage of AgCd and AgSn Compounds by Breaking Arc at Small Operation Numbers
Sub Title (in English)
Keyword(1) Ag compound materials
Keyword(2) breaking arc discharge
Keyword(3) contact damage
Keyword(4) discharge mark
1st Author's Name Hiroshi INOUE
1st Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University()
2nd Author's Name Yuki TAKAHASHI
2nd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University
3rd Author's Name Gaku YAMAMOTO
3rd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering and Resource Science, Akita University
Date 2000/12/8
Paper # EMD2000-82
Volume (vol) vol.100
Number (no) 511
Page pp.pp.-
#Pages 4
Date of Issue