Presentation 2000/12/8
A study on shock hardness for contacts
S. Watanabe, K. Takahashi, H. Kamijima, K. Ohnishi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The minimum level of shock which occures chattering at contacts as electromechanical components used for cellular phone must be known in designing stage. The examination was done if it could guess the minimum level of shock qualitatively by checking the action of the contacts by FEM analysis as well as test with sample.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) cellular phone / mechanical shock / contacts / chattering / FEM analyasis
Paper # EMD2000-77
Date of Issue

Conference Information
Committee EMD
Conference Date 2000/12/8(1days)
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Paper Information
Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A study on shock hardness for contacts
Sub Title (in English)
Keyword(1) cellular phone
Keyword(2) mechanical shock
Keyword(3) contacts
Keyword(4) chattering
Keyword(5) FEM analyasis
1st Author's Name S. Watanabe
1st Author's Affiliation Honda Tsushin Kogyo Co., Ltd. Development Engineering dept.()
2nd Author's Name K. Takahashi
2nd Author's Affiliation Honda Tsushin Kogyo Co., Ltd. Development Engineering dept.
3rd Author's Name H. Kamijima
3rd Author's Affiliation Honda Tsushin Kogyo Co., Ltd. Development Engineering dept.
4th Author's Name K. Ohnishi
4th Author's Affiliation Honda Tsushin Kogyo Co., Ltd. Development Engineering dept.
Date 2000/12/8
Paper # EMD2000-77
Volume (vol) vol.100
Number (no) 511
Page pp.pp.-
#Pages 4
Date of Issue