Presentation | 2000/12/8 A study on shock hardness for contacts S. Watanabe, K. Takahashi, H. Kamijima, K. Ohnishi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The minimum level of shock which occures chattering at contacts as electromechanical components used for cellular phone must be known in designing stage. The examination was done if it could guess the minimum level of shock qualitatively by checking the action of the contacts by FEM analysis as well as test with sample. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | cellular phone / mechanical shock / contacts / chattering / FEM analyasis |
Paper # | EMD2000-77 |
Date of Issue |
Conference Information | |
Committee | EMD |
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Conference Date | 2000/12/8(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
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Assistant |
Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A study on shock hardness for contacts |
Sub Title (in English) | |
Keyword(1) | cellular phone |
Keyword(2) | mechanical shock |
Keyword(3) | contacts |
Keyword(4) | chattering |
Keyword(5) | FEM analyasis |
1st Author's Name | S. Watanabe |
1st Author's Affiliation | Honda Tsushin Kogyo Co., Ltd. Development Engineering dept.() |
2nd Author's Name | K. Takahashi |
2nd Author's Affiliation | Honda Tsushin Kogyo Co., Ltd. Development Engineering dept. |
3rd Author's Name | H. Kamijima |
3rd Author's Affiliation | Honda Tsushin Kogyo Co., Ltd. Development Engineering dept. |
4th Author's Name | K. Ohnishi |
4th Author's Affiliation | Honda Tsushin Kogyo Co., Ltd. Development Engineering dept. |
Date | 2000/12/8 |
Paper # | EMD2000-77 |
Volume (vol) | vol.100 |
Number (no) | 511 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |