| Presentation | 1999/4/16 Reliability of Lead-Free Solders Seiji KARASHIMA, Yuzo IWANAGA, Shinya HAMAGISHI, Nobuhide TAKANO, Ryoji MUTO, Nobuyuki URA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This article reports the results on assessment of lead-free solder reliability. Lead-free solder assessed were Sn-Ag-Bi-Cu, Sn-Ag-Cu-In, and Sn-Ag-Cu. These solders were examined accelerated high temperature test. As a result, the growth of Sn-Cu in Sn-Ag-Bi-Cu was more quickly than the growth of Sn-Cu in other solders. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Sn-Ag-Cu-Bi / Sn-Ag-Cu-In / Sn-Ag-Cu / high temperature test / lead-free solder / Pb-free solder |
| Paper # | EMD99-1 |
| Date of Issue |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 1999/4/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Reliability of Lead-Free Solders |
| Sub Title (in English) | |
| Keyword(1) | Sn-Ag-Cu-Bi |
| Keyword(2) | Sn-Ag-Cu-In |
| Keyword(3) | Sn-Ag-Cu |
| Keyword(4) | high temperature test |
| Keyword(5) | lead-free solder |
| Keyword(6) | Pb-free solder |
| 1st Author's Name | Seiji KARASHIMA |
| 1st Author's Affiliation | Telecommunication Division, Hitachi, Ltd.() |
| 2nd Author's Name | Yuzo IWANAGA |
| 2nd Author's Affiliation | Telecommunication Division, Hitachi, Ltd. |
| 3rd Author's Name | Shinya HAMAGISHI |
| 3rd Author's Affiliation | Telecommunication Division, Hitachi, Ltd. |
| 4th Author's Name | Nobuhide TAKANO |
| 4th Author's Affiliation | Telecommunication Division, Hitachi, Ltd. |
| 5th Author's Name | Ryoji MUTO |
| 5th Author's Affiliation | Telecommunication Division, Hitachi, Ltd. |
| 6th Author's Name | Nobuyuki URA |
| 6th Author's Affiliation | Telecommunication Division, Hitachi, Ltd. |
| Date | 1999/4/16 |
| Paper # | EMD99-1 |
| Volume (vol) | vol.99 |
| Number (no) | 9 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |