Presentation | 1999/1/22 A Study on the Design of Ultraminiature Reed Switches Tatsuo Kobayashi, Kazuya Yokoyama, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In the electronics field, the ever-increasing pressure for miniaturization and high density has had a direct impact on the size of componenets.From its beginnings as a telecommunications solution, the reed switch has made outstanding progress in miniaturization.However, this has conversely led to the decrease in contact force and thus increased the potential of contact failure. In this paper, we pursued the miniaturization of the reed switch while maximizing contact force.As a result, we have found that it is possible to manufacture a reed switch with a 6.0mm inner length, 1.4mm inner diameter and 5gf contact force. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Reed switch / Contact force / Magnetic attractive force / Retractive force / Stiffness / Contact rating |
Paper # | EMD98-82 |
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Conference Information | |
Committee | EMD |
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Conference Date | 1999/1/22(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
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Assistant |
Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study on the Design of Ultraminiature Reed Switches |
Sub Title (in English) | |
Keyword(1) | Reed switch |
Keyword(2) | Contact force |
Keyword(3) | Magnetic attractive force |
Keyword(4) | Retractive force |
Keyword(5) | Stiffness |
Keyword(6) | Contact rating |
1st Author's Name | Tatsuo Kobayashi |
1st Author's Affiliation | Oki Sensor Device Corporation() |
2nd Author's Name | Kazuya Yokoyama |
2nd Author's Affiliation | Oki Sensor Device Corporation |
Date | 1999/1/22 |
Paper # | EMD98-82 |
Volume (vol) | vol.98 |
Number (no) | 554 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |