Presentation 1998/12/18
Wear of Electrical Contacts in n-hexane by Breaking Arc
Naoki Minoura, Tomoyuki Soma, Koichiro Sawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The purpose of this work is to make clear the pehnomena of electrical contacts in liquid environments with light-duty application. The break operation studies have been conducted on Ag and Pd materials under the inductive in three different dielectric liquids(distilled water, methanol and n-hexane). The characteristics of contact resistance and material transfer are strongly affected by dielectric liquids. According to our previous researches, from the phase of material loss and contact resistance, in n-hexane there is the possibility that better contact reliability can be attained with low load current. This is because in n-hexane wear is very littel, owing to a film on the surface made of the carbons contained in n-hexane, though the contact resistance becomes high with high load current. Thus, this paper mainly reports the results of the detailed experiment in n-hexane.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) dielectric liquid / n-hexane arc contact resistance / material wear / contact surface
Paper # EMD98-75
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Committee EMD
Conference Date 1998/12/18(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Wear of Electrical Contacts in n-hexane by Breaking Arc
Sub Title (in English)
Keyword(1) dielectric liquid
Keyword(2) n-hexane arc contact resistance
Keyword(3) material wear
Keyword(4) contact surface
1st Author's Name Naoki Minoura
1st Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Keio University()
2nd Author's Name Tomoyuki Soma
2nd Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Keio University
3rd Author's Name Koichiro Sawa
3rd Author's Affiliation Department of Electrical Engineering, Faculty of Science and Technology, Keio University
Date 1998/12/18
Paper # EMD98-75
Volume (vol) vol.98
Number (no) 494
Page pp.pp.-
#Pages 4
Date of Issue