Presentation 1996/1/19
Contact reliability of connector
Hideyo Hirao, Yoshimi Tubota, Masahumi Aoki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Communication systems require IC sockets because of increase of change in LSI/IC(rest is IC) at work caused by high performance accompanied with, for example, embedded firmware in micro processors. To realize high connecting reliability, it is necessary to make precision of IC lead terminals equal to general connectors. But under the present condition, precision of IC lead terminal in dimension and surface finish is not enough. From this present condition, this paper will report result of tests aimed to ascertain reliability of connection between ICs and IC sockets.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Connector / IC Socket / Surface treatment of contact / IC lead terminal
Paper # EMD95-62
Date of Issue

Conference Information
Committee EMD
Conference Date 1996/1/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
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Topics (in English)
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Paper Information
Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Contact reliability of connector
Sub Title (in English)
Keyword(1) Connector
Keyword(2) IC Socket
Keyword(3) Surface treatment of contact
Keyword(4) IC lead terminal
1st Author's Name Hideyo Hirao
1st Author's Affiliation Hlitachi,Ltd. Telecommunications Division()
2nd Author's Name Yoshimi Tubota
2nd Author's Affiliation Hlitachi,Ltd. Telecommunications Division
3rd Author's Name Masahumi Aoki
3rd Author's Affiliation Yamaichi Electronics Co.,Ltd. Sakura
Date 1996/1/19
Paper # EMD95-62
Volume (vol) vol.95
Number (no) 472
Page pp.pp.-
#Pages 6
Date of Issue