Presentation 1995/11/17
A STAIDY ON THE TUNNEL CONDUCTION THROUGH CONTAMINATED FILM ON CONTACTS BASED ON CLOSE ANALOGY OF CONDUCTION MECHANISM OF SCANNING TUNNELING MICROSCOPE
Terutaka Tamai, Keiichiro Miyagawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) On the conduction mechanism of contacts covered with contaminant films, such various conductions as the tunnel, Schottky, and impurity conduction have been observed. Recovery phenomena of low contct resistance due to electrical breakdown of the film have been reported. However, clarification of the conduction mechanism in detail was not found. Principle of the Scanning Tunneling Microscope (STM) can be recognized as a typical model idealized by the tunnel conduction of the contacts with the film. The feature of the tunnel conduction was clarified by examinations of voltage dependence of STM images. Existence of the tunnel conduction was found from voltage-current characteristics of the contacts with the film in the analogy of STM.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Tunnel conduction / STM / Contact / Contaminant film / Contact resistance
Paper # EMD95-49
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Conference Information
Committee EMD
Conference Date 1995/11/17(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A STAIDY ON THE TUNNEL CONDUCTION THROUGH CONTAMINATED FILM ON CONTACTS BASED ON CLOSE ANALOGY OF CONDUCTION MECHANISM OF SCANNING TUNNELING MICROSCOPE
Sub Title (in English)
Keyword(1) Tunnel conduction
Keyword(2) STM
Keyword(3) Contact
Keyword(4) Contaminant film
Keyword(5) Contact resistance
1st Author's Name Terutaka Tamai
1st Author's Affiliation Hyogo University of Teacher Education, Electronics Institute()
2nd Author's Name Keiichiro Miyagawa
2nd Author's Affiliation Hyogo University of Teacher Education, Electronics Institute
Date 1995/11/17
Paper # EMD95-49
Volume (vol) vol.95
Number (no) 370
Page pp.pp.-
#Pages 6
Date of Issue