Presentation | 1996/12/20 A Measurement of Low Frequency Noise of Static Induction Transistors at Low Temperature Hiroshi INOUE, Yasuo MORINAGA, Keiichi ITOH, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Low frequency noise in the range of 100Hz to 3MHz of static induction transistors is measured. It is compared results of measurement at low temperature (liquid nitrogen's boiling point : 77[K]) and room temperature (293[K]). At low temperature, a channel resistance in the source side r_s, which is principal noise component of flat noise, is decreased. However, the resistance components except r_s is increased. Therefore, the dependancy on r_s in flat noise at low temperature is lower than at room temperature. The slope of 1/f noise becomes steeper, then crossover frequency shifts to lower frequency. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | SIT / Low Temperature / 1/f Noise / Flat noise / Channel resistance in the source side |
Paper # | EMD96-86 |
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Committee | EMD |
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Conference Date | 1996/12/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Measurement of Low Frequency Noise of Static Induction Transistors at Low Temperature |
Sub Title (in English) | |
Keyword(1) | SIT |
Keyword(2) | Low Temperature |
Keyword(3) | 1/f Noise |
Keyword(4) | Flat noise |
Keyword(5) | Channel resistance in the source side |
1st Author's Name | Hiroshi INOUE |
1st Author's Affiliation | Department of Electrical and Electronic Engineering, Mining College, Akita University() |
2nd Author's Name | Yasuo MORINAGA |
2nd Author's Affiliation | Department of Electrical and Electronic Engineering, Mining College, Akita University |
3rd Author's Name | Keiichi ITOH |
3rd Author's Affiliation | Department of Electrical Engineering, Akita National College of Technology |
Date | 1996/12/20 |
Paper # | EMD96-86 |
Volume (vol) | vol.96 |
Number (no) | 438 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |