Presentation | 1996/12/20 The Discussion of Switching Behavior of Miniaturization Relay with Single and Twin Contacts at microload current Min-gou Wang, Koichiro Sawa, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is expected that relays and switches with twin contacts can obtain a higher reliability and longer life. In order to verify this consideration, the experiments were performed with the relays, which have single or twin contacts respectively. The results demonstrated that main failure for the contacts tested under less than DC 500mA/5V is sticking. Beause of the difference in stracture of the spring the twin contact is easier to stick than the single one. On the other hand, the resistance of the twin contact is lower and more stable than that of the single one, and the average contact resistance becomes smaller along with increasing in load current. The sticking is an important item to be considered in miniaturization relay quality and reliability |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | contact resistance / single contact / twin contact / sticking / weibull distrbution |
Paper # | EMD96-80 |
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Committee | EMD |
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Conference Date | 1996/12/20(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | The Discussion of Switching Behavior of Miniaturization Relay with Single and Twin Contacts at microload current |
Sub Title (in English) | |
Keyword(1) | contact resistance |
Keyword(2) | single contact |
Keyword(3) | twin contact |
Keyword(4) | sticking |
Keyword(5) | weibull distrbution |
1st Author's Name | Min-gou Wang |
1st Author's Affiliation | Department of Electrical engineering, Faculty of Science and Technology, Keio University() |
2nd Author's Name | Koichiro Sawa |
2nd Author's Affiliation | Department of Electrical engineering, Faculty of Science and Technology, Keio University |
Date | 1996/12/20 |
Paper # | EMD96-80 |
Volume (vol) | vol.96 |
Number (no) | 438 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |